Handbook of Practical X-Ray Fluorescence Analysis
X-Ray Fluorescence analysis (XRF) is a reliable multi-elemental and nondestructive analytical method widely used in research and industrial applications. This practical handbook provides self-contained modules featuring XRF instrumentation, quantification methods, and most of the current applications. The broad spectrum of topics is due to the efforts of a large number of authors from a variety of different types of institutions such as universities, research institutes, and companies. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. This practical handbook is intended as a resource for graduate students, research scientists, and industrial users.
Synchrotron radiation source
Mirror optics
Diffraction optics
Optics for monochromators
Focusing diffraction optics
Refraction X-ray optics
X-ray detectors and signal processing
High resolution imaging X-ray CCD spectrometers
Wavelength dispersive XRF and a comparison with EDS
Quantitative analysis
Specimen preparation
Micro-X-ray fluorescence spectroscopy
Micro XRF with synchrotron radiation
TXRF wafer analysis
Analysis of layers
Environmental studies
Geology, mining, metallurgy
Arts and archaeology
XRF-application in numismatics
Analysis for forensic investigations
X-Ray fluorescence analysis in the life sciences
Non-invasive identification of chemical compounds by EDXRS
X-ray safety and protection
Useful data sources and links.
X-ray tubes
RadioisotopesSynchrotron radiation source
Mirror optics
Diffraction optics
Optics for monochromators
Focusing diffraction optics
Refraction X-ray optics
X-ray detectors and signal processing
High resolution imaging X-ray CCD spectrometers
Wavelength dispersive XRF and a comparison with EDS
Quantitative analysis
Specimen preparation
Micro-X-ray fluorescence spectroscopy
Micro XRF with synchrotron radiation
TXRF wafer analysis
Analysis of layers
Environmental studies
Geology, mining, metallurgy
Arts and archaeology
XRF-application in numismatics
Analysis for forensic investigations
X-Ray fluorescence analysis in the life sciences
Non-invasive identification of chemical compounds by EDXRS
X-ray safety and protection
Useful data sources and links.
Beckhoff, Burkhard
Kanngießer, Birgit
Langhoff, Norbert
Wedell, Reiner
Wolff, Helmut
ISBN | 9783540367222 |
---|---|
Artikelnummer | 9783540367222 |
Medientyp | E-Book - PDF |
Copyrightjahr | 2007 |
Verlag | Springer-Verlag |
Umfang | 878 Seiten |
Sprache | Englisch |
Kopierschutz | Digitales Wasserzeichen |