Structure Analysis of Advanced Nanomaterials. Vol.1
Nanoworld by High-Resolution Electron Microscopy
High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.
Oku, Takeo
| ISBN | 9783110304725 |
|---|---|
| Artikelnummer | 9783110304725 |
| Medientyp | Buch |
| Copyrightjahr | 2014 |
| Verlag | De Gruyter |
| Umfang | X, 168 Seiten |
| Abbildungen | 94 b/w ill., 21 b/w tbl. |
| Sprache | Englisch |
