Transmission Electron Microscopy Characterization of Nanomaterials

Transmission Electron Microscopy Characterization of Nanomaterials

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Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.


TEM Characterization of Biological and Inorganic Nanocomposites
Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials
TEM for Characterization of Semiconductor Nanomaterials
Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods
TEM for Characterization of Core-Shell Nanomaterials
Valence Electron Spectroscopy by Transmission Electron Microscopy
TEM Characterization of Nanocomposite Materials
High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires
Electron Microscopy for Characterization of Thermoelectric Nanomaterials
TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites
TEM Characterization of Metallic Nanocatalysts
3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures
ISBN 978-3-662-52462-6
Artikelnummer 9783662524626
Medientyp Buch
Auflage Softcover reprint of the original 1st ed. 2014
Copyrightjahr 2016
Verlag Springer, Berlin
Umfang 717 Seiten
Abbildungen IX, 717 p. 402 illus., 264 illus. in color.
Sprache Englisch